Interaction of RuO<sub>2</sub> and Lead-Silicate Glass in Thick-Film Resistors
نویسندگان
چکیده
منابع مشابه
Noise properties of thick-film resistors in extended temperature range
Results of thorough experimental studies on electrical properties of thick-film resistors (TFRs) have been overviewed and summarized. Experiments covered resistance and noise measurements in wide temperature range. Low-frequency noise spectroscopy has been used for the investigations of fluctuating phenomena. Sample resistors were prepared of various combinations of commercial and laboratory-ma...
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Low-frequency noise spectroscopy is used to examine the interactions between resistive and conductive films that take place during thick-film resistor (TFR) fabrication. Two noise parameters are introduced to quantitatively describe the strength of these interactions. They refer to intensity and repeatability of the noise generated in the resistor interfaces. Extensive experimental studies perf...
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The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to...
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Microbubble whispering gallery resonators have the potential to become key components in a variety of active and passive photonic circuit devices by offering a range of significant functionalities. Here, we report on the fabrication, optical characterization, and theoretical analysis of lead-silicate glass, optical microbubble resonators. Evanescent field coupling to the microbubbles was achiev...
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Thick-film resistors (TFRs) consist of a percolating network of conducting oxide nanoparticles dispersed in an insulating glassy matrix, whose resistive properties are dominated by quantum tunneling across insulating layers separating adjacent conducting grains. Tunneling processes are at the origin of the high sensitivity of the TFRs resistances to applied strains. We have measured transport a...
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ژورنال
عنوان ژورنال: World Journal of Condensed Matter Physics
سال: 2011
ISSN: 2160-6919,2160-6927
DOI: 10.4236/wjcmp.2011.11001